Applications of the S5180B include RF component design and testing, on-wafer probing,
field testing, insertion loss measurement, distance to fault measurements, antenna matching,
quality control, material measurements, and many others.
Pulse modulated measurements are utilized in high power amplifiers development, manufacturing,
and testing, especially on-wafer components where a heat sync isn’t practical. S5180B has
built-in HW and with additional SW can support various types of pulse measurements.
The S5180B VNAs come with all the software features engineers have come to expect, at no additional
cost. Standard software features include:
- ● Linear/logarithmic sweeps with multiple trace formats
- ● Power sweeps
- ● Time domain and gating conversion
- ● Frequency offset mode
- ● Fixture simulation (embedding/de-embedding)
- ●16 independent channels with up to 16 traces each
- ●Markers with marker search tools and marker math, various conversion algorithms, and limit tests for pass/fail criteria, etc.
- ● Test Automation programming in LabView, Python, MATLAB, .NET, etc.
S5180B is the first CMT VNA with built-in Pulse Modulation Generation/Measurement capabilities.
The Pulse Modulation feature is a paid software option sold separately from the VNA and is
only compatible with the S5180B VNA due to hardware requirements. The Pulse Modulation option
can be added at any time during or after the initial VNA purchase.
S5180B has built-in HW and additional SW that can support various types of pulse measurements.
Pulses can be generated Synchronously or Asynchronously with respect to VNA measurement timing.
Wideband detection mode is used for Synchronously generated pulses with S-parameter measurements
completed within each RF pulse. In this case, most of the RF pulse spectrum is in the IF filter
bandwidth, and the measurement dynamic range is therefore preserved.
Narrowband detection mode is used for Asynchronously generated pulses with S-parameter measurements
made over a series of RF pulses. In this scenario, most of the RF pulse spectrum is outside the IF
filter bandwidth and the only central carrier frequency is within the filter. This allows for the
measurement of narrower pulses with some degradation of measurement dynamic range.
Pulse Profile mode measures the pulse envelope in time domain. All points of the pulse profile
are gathered during one pulse duration. CMT’s Manufacturing Test plugin is available to integrate the VNA into your production test system.